Probing local strain and composition in Ge nanowires by means of tip-enhanced Raman scattering

J. S. Reparaz, N. Peica, R. Kirste, A. R. Goñi, M. R. Wagner, G. Callsen, M. I. Alonso, M. Garriga, I. C. Marcus, A. Ronda, I. Berbezier, J. Maultzsch, C. Thomsen, A. Hoffmann

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