Predictive model for scanned probe oxidation kinetics

J. A. Dagata, F. Perez-Murano, G. Abadal, K. Morimoto, T. Inoue, J. Itoh, H. Yokoyama

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    109 Citations (Scopus)

    Abstract

    Previous descriptions of scanned probe oxidation kinetics involved implicit assumptions that one-dimensional, steady-state models apply for arbitrary values of applied voltage and pulse duration. These assumptions have led to inconsistent interpretations regarding the fundamental processes that contribute to control of oxide growth rate. We propose a model that includes a temporal crossover of the system from transient to steady-state growth and a spatial crossover from predominantly vertical to coupled lateral growth. The model provides an excellent fit of available experimental data. © 2000 American Institute of Physics.
    Original languageEnglish
    Pages (from-to)2710-2712
    JournalApplied Physics Letters
    Volume76
    DOIs
    Publication statusPublished - 8 May 2000

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