Pre-breakdown and post-breakdown switching behaviour of SiO2 breakdown spots observed with C-AFM

M. Porti, X. Blasco, M. Nafría, X. Aymerich, A. Olbrich, B. Ebersberger

    Research output: Contribution to journalArticleResearch

    Original languageEnglish
    Pages (from-to)164-167
    JournalNanotechnology
    Volume12
    Publication statusPublished - 1 Jan 2001

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