Pre- and post-breakdown switching behaviour in ultrathin SiO2 layers detected by C-AFM

M Porti, X Blasco, M Nafría, X Aymerich, A Olbrich, B Ebersberger

    Research output: Contribution to journalArticleResearch

    4 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)164-167
    JournalNanotechnology
    Volume12
    DOIs
    Publication statusPublished - 1 Jan 2001

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