Physical model for the voltage and temperature dependence of the soft breakdown current in ultrathin gate oxides

Enrique Alberto Miranda Castellano, A. Avellán, D. Schroeder, W. Krautschneider

Research output: Contribution to journalArticleResearch

Original languageEnglish
Pages (from-to)---
JournalJournal of Applied Physics
Volume97
Publication statusPublished - 1 Jan 2005

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