Physical model for the voltage and temperature dependence of the soft breakdown current in ultrathin gate oxides

Enrique Alberto Miranda Castellano, A. Avellán, D. Schroeder, W. Krautschneider

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Cite this

@article{43cb0f6235e4400387a4c1026dc502c9,

title = "Physical model for the voltage and temperature dependence of the soft breakdown current in ultrathin gate oxides",

author = "{Miranda Castellano}, {Enrique Alberto} and A. Avell{\'a}n and D. Schroeder and W. Krautschneider",

year = "2005",

month = jan,

day = "1",

language = "English",

volume = "97",

pages = "------",

}