Perpendicular critical-state susceptibility of square superconducting films

D. X. Chen; C. Navau; N. Del-Valle; A. Sanchez

doi:10.1063/1.2931707

Perpendicular critical-state susceptibility of square superconducting films

D. X. Chen, C. Navau, N. Del-Valle, A. Sanchez

Department of Physics

Research output: Contribution to journal › Article › Research › peer-review

15 Citations (Scopus)

Abstract

In order to better study the electromagnetic properties of superconducting films, the perpendicular critical-state ac susceptibility X= X′ -j X″ of a square superconducting film is numerically calculated using a magnetic energy minimization procedure as a function of the field amplitude Hm. The emphasis is put on the calculation accuracy of the low- Hm limit X0and the Hm at X″ = Xm″. It is shown that after having accurate X0, X (Hm) of the square film can be accurately scaled from the analytical X (Hm) of a thin disk. © 2008 American Institute of Physics.

Original language	English
Article number	202503
Journal	Applied Physics Letters
Volume	92
Issue number	20
DOIs	https://doi.org/10.1063/1.2931707
Publication status	Published - 30 May 2008

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@article{23af8c62c56c418092cfd5371db929b5,

title = "Perpendicular critical-state susceptibility of square superconducting films",

abstract = "In order to better study the electromagnetic properties of superconducting films, the perpendicular critical-state ac susceptibility X= X′ -j X″ of a square superconducting film is numerically calculated using a magnetic energy minimization procedure as a function of the field amplitude Hm. The emphasis is put on the calculation accuracy of the low- Hm limit X0and the Hm at X″ = Xm″. It is shown that after having accurate X0, X (Hm) of the square film can be accurately scaled from the analytical X (Hm) of a thin disk. {\textcopyright} 2008 American Institute of Physics.",

author = "Chen, {D. X.} and C. Navau and N. Del-Valle and A. Sanchez",

year = "2008",

month = may,

day = "30",

doi = "10.1063/1.2931707",

language = "English",

volume = "92",

number = "20",

}

TY - JOUR

T1 - Perpendicular critical-state susceptibility of square superconducting films

AU - Chen, D. X.

AU - Navau, C.

AU - Del-Valle, N.

AU - Sanchez, A.

PY - 2008/5/30

Y1 - 2008/5/30

N2 - In order to better study the electromagnetic properties of superconducting films, the perpendicular critical-state ac susceptibility X= X′ -j X″ of a square superconducting film is numerically calculated using a magnetic energy minimization procedure as a function of the field amplitude Hm. The emphasis is put on the calculation accuracy of the low- Hm limit X0and the Hm at X″ = Xm″. It is shown that after having accurate X0, X (Hm) of the square film can be accurately scaled from the analytical X (Hm) of a thin disk. © 2008 American Institute of Physics.

AB - In order to better study the electromagnetic properties of superconducting films, the perpendicular critical-state ac susceptibility X= X′ -j X″ of a square superconducting film is numerically calculated using a magnetic energy minimization procedure as a function of the field amplitude Hm. The emphasis is put on the calculation accuracy of the low- Hm limit X0and the Hm at X″ = Xm″. It is shown that after having accurate X0, X (Hm) of the square film can be accurately scaled from the analytical X (Hm) of a thin disk. © 2008 American Institute of Physics.

U2 - 10.1063/1.2931707

DO - 10.1063/1.2931707

M3 - Article

VL - 92

IS - 20

M1 - 202503

ER -