Oxide degradation and breakdown in stressed MOS capacitors

Translated title of the contribution: Oxide degradation and breakdown in stressed MOS capacitors

I. Placencia, J. Suñé, N. Barniol, E. Farrés, X. Aymerich

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Translated title of the contributionOxide degradation and breakdown in stressed MOS capacitors
Original languageMultiple languages
Pages (from-to)783-786
JournalJ. Phys. (Paris)
Issue number49
Publication statusPublished - 1 Jan 1988

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