We propose and outline three independent experimental methodologies applicable to the investigation of voltage acceleration models of time to breakdown (TBD) for dielectric breakdown. The self-consistence requirement of voltage acceleration models and Poisson random statistics in terms of area scaling is discussed in detail. Three different TBD acceleration models, which are TBD exponential law (E model), TBD power law, and TBD exponential law of reciprocal voltage and field (1/V model or 1/E model), as widely discussed in literature, are evaluated in the context of these new methodologies. We have found that the TBD exponential law of reciprocal voltage (1/V model) is the best description for the TBD voltage acceleration in the Fowler-Nordheim tunneling regime while the TBD power-law model is the most appropriate in the direct tunneling regime. © 2009 IEEE.
|Journal||IEEE Transactions on Electron Devices|
|Publication status||Published - 16 Jun 2009|
- Dielectric breakdown
- Reliability projection
- Voltage acceleration models