On the three-dimensional scanning tunneling microscopy formalism

Research output: Contribution to journalArticleResearch

Original languageEnglish
Pages (from-to)483-487
JournalJournal of vacuum science & technology. B, Microelectronics processing and phenomena
Volume9
DOIs
Publication statusPublished - 1 Jan 1991

Cite this

Barniol, N., Pérez, F., & Aymerich, X. (1991). On the three-dimensional scanning tunneling microscopy formalism. Journal of vacuum science & technology. B, Microelectronics processing and phenomena, 9, 483-487. https://doi.org/10.1116/1.585551