Original language | English |
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Title of host publication | IEEE International Workshop on IDDG Testing |
Editors | Malaiya, Y. K., Jayasumana, A.P. |
Place of Publication | Piscataway (US) |
Pages | 110-111 |
Number of pages | 1 |
Edition | 1 |
Publication status | Published - 1 Jan 1995 |
On the sensitization of iddg faults by symbolic simulation
L. Ribas, J. Carrabina
Research output: Chapter in Book › Chapter › Research