On the sensitization of iddg faults by symbolic simulation

L. Ribas, J. Carrabina

    Research output: Chapter in BookChapterResearch

    Original languageEnglish
    Title of host publicationIEEE International Workshop on IDDG Testing
    Editors Malaiya, Y. K., Jayasumana, A.P.
    Place of PublicationPiscataway (US)
    Pages110-111
    Number of pages1
    Edition1
    Publication statusPublished - 1 Jan 1995

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