On the breakdown statistics of very thin SiO2 films

J. Suñé, I. Placencia, N. Barniol, E. Farrés, F. Martín, X. Aymerich

Research output: Contribution to journalArticleResearch

215 Citations (Scopus)
Original languageEnglish
Pages (from-to)347-362
JournalThin Solid Films
Volume185
Publication statusPublished - 1 Jan 1990

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