On the Aging of OTFTs and Its Impact on PUFs Reliability

Marc Porti; Gerard Palau; Albert Crespo-Yepes; August Arnal Rus; Simon Ogier; Eloi Ramon; Montserrat Nafria

doi:10.3390/mi15040443

On the Aging of OTFTs and Its Impact on PUFs Reliability

Marc Porti, Gerard Palau, Albert Crespo-Yepes, August Arnal Rus, Simon Ogier, Eloi Ramon, Montserrat Nafria

Research output: Contribution to journal › Article › Research › peer-review

5 Downloads (Pure)

Abstract

Given the current maturity of printed technologies, Organic Thin-Film Transistors (OTFT) still show high initial variability, which can be beneficial for its exploitation in security applications. In this work, the process-related variability and aging of commercial OTFTs have been characterized to evaluate the feasibility of OTFTs-based Physical Unclonable Functions (PUFs) implementation. For our devices, I D -based PUFs show good uniformity and uniqueness. However, PUFs' reliability could be compromised because of the observed transient and aging effects in the OTFTs, which could hinder the reproducibility of the generated fingerprints. A systematic study of the aging of OTFTs has been performed to evaluate the PUFs' reliability. Our results suggest that the observed transient and aging effects could be mitigated so that the OTFTs-based PUFs' reliability could be improved.

Original language	English
Article number	443
Number of pages	10
Journal	Micromachines
Volume	15
Issue number	4
DOIs	https://doi.org/10.3390/mi15040443
Publication status	Published - 26 Mar 2024

Keywords

BTI
HCI
OTFT
PUF
aging
reliability
variability

Access to Document

10.3390/mi15040443Licence: CC BY

https://ddd.uab.cat/record/291256

Cite this

@article{9ea5d56f53c64fca8992418523e245ba,

title = "On the Aging of OTFTs and Its Impact on PUFs Reliability",

abstract = "Given the current maturity of printed technologies, Organic Thin-Film Transistors (OTFT) still show high initial variability, which can be beneficial for its exploitation in security applications. In this work, the process-related variability and aging of commercial OTFTs have been characterized to evaluate the feasibility of OTFTs-based Physical Unclonable Functions (PUFs) implementation. For our devices, I D -based PUFs show good uniformity and uniqueness. However, PUFs' reliability could be compromised because of the observed transient and aging effects in the OTFTs, which could hinder the reproducibility of the generated fingerprints. A systematic study of the aging of OTFTs has been performed to evaluate the PUFs' reliability. Our results suggest that the observed transient and aging effects could be mitigated so that the OTFTs-based PUFs' reliability could be improved. ",

keywords = "BTI, HCI, OTFT, PUF, aging, reliability, variability",

author = "Marc Porti and Gerard Palau and Albert Crespo-Yepes and Rus, {August Arnal} and Simon Ogier and Eloi Ramon and Montserrat Nafria",

note = "Publisher Copyright: {\textcopyright} 2024 by the authors.",

year = "2024",

month = mar,

day = "26",

doi = "10.3390/mi15040443",

language = "English",

volume = "15",

journal = "Micromachines",

issn = "2072-666X",

publisher = "Multidisciplinary Digital Publishing Institute (MDPI)",

number = "4",

}

TY - JOUR

T1 - On the Aging of OTFTs and Its Impact on PUFs Reliability

AU - Porti, Marc

AU - Palau, Gerard

AU - Crespo-Yepes, Albert

AU - Rus, August Arnal

AU - Ogier, Simon

AU - Ramon, Eloi

AU - Nafria, Montserrat

PY - 2024/3/26

Y1 - 2024/3/26

N2 - Given the current maturity of printed technologies, Organic Thin-Film Transistors (OTFT) still show high initial variability, which can be beneficial for its exploitation in security applications. In this work, the process-related variability and aging of commercial OTFTs have been characterized to evaluate the feasibility of OTFTs-based Physical Unclonable Functions (PUFs) implementation. For our devices, I D -based PUFs show good uniformity and uniqueness. However, PUFs' reliability could be compromised because of the observed transient and aging effects in the OTFTs, which could hinder the reproducibility of the generated fingerprints. A systematic study of the aging of OTFTs has been performed to evaluate the PUFs' reliability. Our results suggest that the observed transient and aging effects could be mitigated so that the OTFTs-based PUFs' reliability could be improved.

AB - Given the current maturity of printed technologies, Organic Thin-Film Transistors (OTFT) still show high initial variability, which can be beneficial for its exploitation in security applications. In this work, the process-related variability and aging of commercial OTFTs have been characterized to evaluate the feasibility of OTFTs-based Physical Unclonable Functions (PUFs) implementation. For our devices, I D -based PUFs show good uniformity and uniqueness. However, PUFs' reliability could be compromised because of the observed transient and aging effects in the OTFTs, which could hinder the reproducibility of the generated fingerprints. A systematic study of the aging of OTFTs has been performed to evaluate the PUFs' reliability. Our results suggest that the observed transient and aging effects could be mitigated so that the OTFTs-based PUFs' reliability could be improved.

KW - BTI

KW - HCI

KW - OTFT

KW - PUF

KW - aging

KW - reliability

KW - variability

UR - http://www.scopus.com/inward/record.url?scp=85191367247&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/2d12feec-d7fa-3cd2-922b-a1c86d1c90d8/

U2 - 10.3390/mi15040443

DO - 10.3390/mi15040443

M3 - Article

C2 - 38675255

SN - 2072-666X

VL - 15

JO - Micromachines

JF - Micromachines

IS - 4

M1 - 443

ER -

On the Aging of OTFTs and Its Impact on PUFs Reliability

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this