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New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM
M. Maestro, J. Diaz, A. Crespo-Yepes, M. B. Gonzalez, J. Martin-Martinez, R. Rodriguez, M. Nafria, F. Campabadal, X. Aymerich
Research output: Contribution to journal › Article › Research › peer-review
13
Citations
(Scopus)