NBTI related time-dependent variability of mobility and threshold voltage in pMOSFETs and their impact on circuit performance

N. Ayala, E. Amat, M. B. Gonzalez, P. Verheyen, R. Rodriguez, M. Nafria, X. Aymerich, E. Simoen, Javier Martin Martinez

Research output: Contribution to journalArticleResearch

5 Citations (Scopus)
Original languageEnglish
Pages (from-to)1384-1387
JournalMicroelectronics Engineering
Volume88
Issue number7
DOIs
Publication statusPublished - 1 Jan 2011

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