TY - JOUR
T1 - Multiwavelength excitation Raman scattering analysis of bulk and two-dimensional MoS2: Vibrational properties of atomically thin MoS2 layers
AU - Placidi, Marcel
AU - Dimitrievska, Mirjana
AU - Izquierdo-Roca, Victor
AU - Fontané, Xavier
AU - Castellanos-Gomez, Andres
AU - Pérez-Tomás, Amador
AU - Mestres, Narcis
AU - Espindola-Rodriguez, Moises
AU - López-Marino, Simon
AU - Neuschitzer, Markus
AU - Bermudez, Veronica
AU - Yaremko, Anatoliy
AU - Pérez-Rodríguez, Alejandro
PY - 2015/7/7
Y1 - 2015/7/7
N2 - © 2015 IOP Publishing Ltd. In order to deepen the knowledge of the vibrational properties of two-dimensional (2D) MoS2 atomic layers, a complete and systematic Raman scattering analysis has been performed using both bulk single-crystal MoS2 samples and atomically thin MoS2 layers. Raman spectra have been measured under non-resonant and resonant conditions using seven different excitation wavelengths from near-infrared (NIR) to ultraviolet (UV). These measurements have allowed us to observe and identify 41 peaks, among which 22 have not been previously experimentally observed for this compound, and characterize the existence of different resonant excitation conditions for the different excitation wavelengths. This has also included the first analysis of resonant Raman spectra that are achieved using UV excitation conditions. In addition, the analysis of atomically thin MoS2 layers has corroborated the higher potential of UV resonant Raman scattering measurements for the non-destructive assessment of 2D MoS2 samples. Analysis of the relative integral intensity of the additional first- and second-order peaks measured under UV resonant excitation conditions is proposed for the non-destructive characterization of the thickness of the layers, complementing previous studies based on the changes of the peak frequencies.
AB - © 2015 IOP Publishing Ltd. In order to deepen the knowledge of the vibrational properties of two-dimensional (2D) MoS2 atomic layers, a complete and systematic Raman scattering analysis has been performed using both bulk single-crystal MoS2 samples and atomically thin MoS2 layers. Raman spectra have been measured under non-resonant and resonant conditions using seven different excitation wavelengths from near-infrared (NIR) to ultraviolet (UV). These measurements have allowed us to observe and identify 41 peaks, among which 22 have not been previously experimentally observed for this compound, and characterize the existence of different resonant excitation conditions for the different excitation wavelengths. This has also included the first analysis of resonant Raman spectra that are achieved using UV excitation conditions. In addition, the analysis of atomically thin MoS2 layers has corroborated the higher potential of UV resonant Raman scattering measurements for the non-destructive assessment of 2D MoS2 samples. Analysis of the relative integral intensity of the additional first- and second-order peaks measured under UV resonant excitation conditions is proposed for the non-destructive characterization of the thickness of the layers, complementing previous studies based on the changes of the peak frequencies.
KW - Atomically thin layers
KW - Molybdenum disulfide
KW - Multiwavelength excitation
KW - Raman resonance
KW - Raman spectroscopy
KW - Transition metal dichalcogenides
KW - Ultraviolet Raman
U2 - 10.1088/2053-1583/2/3/035006
DO - 10.1088/2053-1583/2/3/035006
M3 - Article
VL - 2
IS - 3
M1 - 035006
ER -