Modeling the breakdown statistics of Al2O3/HfO2 nanolaminates grown by atomic-layer-deposition

A. Conde, D. Jiménez, E. Miranda, JM Rafi, F. Campabadal, J. Suñé, Carme Martinez Domingo

Research output: Contribution to journalArticleResearch

9 Citations (Scopus)
Original languageEnglish
Pages (from-to)48-52
JournalSolid State-Electronics
Volume71
DOIs
Publication statusPublished - 1 May 2012

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