Modeling of the leakage current through broken down TiO2/SiO2 gate stacks

E. Miranda, J. Tinoco, I. Garduno, M. Estrada, A. Cerdeira

Research output: Contribution to journal › Article › Research

Cite this

@article{fbdcbb7b8fd64e7a92c0d48e704fd437,

title = "Modeling of the leakage current through broken down TiO2/SiO2 gate stacks",

author = "E. Miranda and J. Tinoco and I. Garduno and M. Estrada and A. Cerdeira",

year = "2009",

month = jan,

day = "1",

language = "English",

pages = "------",

journal = "Thin Solid Films",

issn = "0040-6090",

}