Original language | English |
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Pages (from-to) | --- |
Journal | Thin Solid Films |
Publication status | Published - 1 Jan 2009 |
Modeling of the leakage current through broken down TiO2/SiO2 gate stacks
E. Miranda, J. Tinoco, I. Garduno, M. Estrada, A. Cerdeira
Research output: Contribution to journal › Article › Research