Modeling of the leakage current through broken down TiO2/SiO2 gate stacks

E. Miranda, J. Tinoco, I. Garduno, M. Estrada, A. Cerdeira

Research output: Contribution to journalArticleResearch

Original languageEnglish
Pages (from-to)---
JournalThin Solid Films
Publication statusPublished - 1 Jan 2009

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