Micro and nano analysis of 0.2Ωmm Ti/Al/Ni/Au ohmic contact to AlGaN/GaN

A. Fontserè; A. Pérez-Tomás; M. Placidi; J. Llobet; N. Baron; S. Chenot; Y. Cordier; J. C. Moreno; P. M. Gammon; M.R. Jennings; M. Porti; A. Bayerl; M. Lanza; M. Nafría

Micro and nano analysis of 0.2Ωmm Ti/Al/Ni/Au ohmic contact to AlGaN/GaN

A. Fontserè, A. Pérez-Tomás, M. Placidi, J. Llobet, N. Baron, S. Chenot, Y. Cordier, J. C. Moreno, P. M. Gammon, M.R. Jennings, M. Porti, A. Bayerl, M. Lanza, M. Nafría

Department of Electronic Engineering

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	2135-104-2013504-3
Journal	Applied Physics Letters
Volume	99
Publication status	Published - 1 Jan 2011

Cite this

@article{7b9dc4318dcc4ab2a496640d9264b504,

title = "Micro and nano analysis of 0.2Ωmm Ti/Al/Ni/Au ohmic contact to AlGaN/GaN",

author = "A. Fontser{\`e} and A. P{\'e}rez-Tom{\'a}s and M. Placidi and J. Llobet and N. Baron and S. Chenot and Y. Cordier and Moreno, {J. C.} and Gammon, {P. M.} and M.R. Jennings and M. Porti and A. Bayerl and M. Lanza and M. Nafr{\'i}a",

year = "2011",

month = jan,

day = "1",

language = "English",

volume = "99",

pages = "2135--104--2013504--3",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Micro and nano analysis of 0.2Ωmm Ti/Al/Ni/Au ohmic contact to AlGaN/GaN

AU - Fontserè, A.

AU - Pérez-Tomás, A.

AU - Placidi, M.

AU - Llobet, J.

AU - Baron, N.

AU - Chenot, S.

AU - Cordier, Y.

AU - Moreno, J. C.

AU - Gammon, P. M.

AU - Jennings, M.R.

AU - Porti, M.

AU - Bayerl, A.

AU - Lanza, M.

AU - Nafría, M.

PY - 2011/1/1

Y1 - 2011/1/1

M3 - Article

SN - 0003-6951

VL - 99

SP - 2135-104-2013504-3

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -