Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays

Gang Niu, Xavier Cartoixà, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Eduardo Perez, Markus Andreas Schubert, Peter Zaumseil, Ioan Costina, Thomas Schroeder, Christian Wenger

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science