Measurement of thresold voltages of thin film accumulation mode PMOS/SOI

A. Terao, D. Flandre, LORA TAMAYO E., F. Van de Wiele

Research output: Contribution to journal › Article › Research

82 Citations (Scopus)

Original language	English
Pages (from-to)	682-684
Journal	IEEE Electron Device Letters
Volume	12
Issue number	12
DOIs	https://doi.org/10.1109/55.116954
Publication status	Published - 1 Jan 1991

Access to Document

@article{c9f66009c98d41cd82ea869962af1c19,

title = "Measurement of thresold voltages of thin film accumulation mode PMOS/SOI",

author = "A. Terao and D. Flandre and E., {LORA TAMAYO} and Wiele, {F. Van de}",

year = "1991",

month = jan,

day = "1",

doi = "10.1109/55.116954",

language = "English",

volume = "12",

pages = "682--684",

journal = "IEEE Electron Device Letters",

issn = "0741-3106",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "12",

}

TY - JOUR

T1 - Measurement of thresold voltages of thin film accumulation mode PMOS/SOI

AU - Terao, A.

AU - Flandre, D.

AU - E., LORA TAMAYO

AU - Wiele, F. Van de

PY - 1991/1/1

Y1 - 1991/1/1

U2 - 10.1109/55.116954

DO - 10.1109/55.116954

M3 - Article

SN - 0741-3106

VL - 12

SP - 682

EP - 684

JO - IEEE Electron Device Letters

JF - IEEE Electron Device Letters

IS - 12

ER -