Measurement of thresold voltages of thin film accumulation mode PMOS/SOI

A. Terao, D. Flandre, LORA TAMAYO E., F. Van de Wiele

Research output: Contribution to journalArticleResearch

77 Citations (Scopus)
Original languageEnglish
Pages (from-to)682-684
JournalIEEE Electron Device Letters
Volume12
Issue number12
DOIs
Publication statusPublished - 1 Jan 1991

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