Local current fluctuations before and after breakdown of thin SiO<inf>2</inf> films observed with conductive atomic force microscope

M. Porti, X. Blasco, M. Nafría, X. Aymerich, A. Olbrich, B. Ebersberger

    Research output: Contribution to journal › Article › Research › peer-review

    3 Citations (Scopus)

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