| Original language | English |
|---|---|
| Pages (from-to) | 39-44 |
| Journal | Microelectronic Engineering |
| Volume | 72 |
| DOIs | |
| Publication status | Published - 1 Jan 2004 |
Limits of the successive breakdown statistics to assess chip reliability
Jorge Francisco Suñe Tarruella, E. Wu, W. Lai
Research output: Contribution to journal › Article › Research
6
Citations
(Scopus)