Original language | English |
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Pages (from-to) | 39-44 |
Journal | Microelectronic Engineering |
Volume | 72 |
DOIs | |
Publication status | Published - 1 Jan 2004 |
Limits of the successive breakdown statistics to assess chip reliability
Jorge Francisco Suñe Tarruella, E. Wu, W. Lai
Research output: Contribution to journal › Article › Research
6
Citations
(Scopus)