Limits of the successive breakdown statistics to assess chip reliability

Research output: Contribution to journal › Article › Research

Original language	English
Pages (from-to)	39-44
Journal	Microelectronic Engineering
Volume	72
DOIs	https://doi.org/10.1016/j.mee.2003.12.013
Publication status	Published - 1 Jan 2004

Access to Document

@article{6145152ba9c7421c8a20733da2582e92,

title = "Limits of the successive breakdown statistics to assess chip reliability",

author = "{Su{\~n}e Tarruella}, {Jorge Francisco} and E. Wu and W. Lai",

year = "2004",

month = jan,

day = "1",

doi = "10.1016/j.mee.2003.12.013",

language = "English",

volume = "72",

pages = "39--44",

journal = "Microelectronic Engineering",

issn = "0167-9317",

}