Original language | English |
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Title of host publication | Proceedings of the EURO-DAC |
Editors | ISBN: 0-8186-4350-1 |
Place of Publication | (US) |
Pages | 214-218 |
Number of pages | 4 |
Edition | 1 |
Publication status | Published - 1 Jan 1993 |
Layout Level Design for Testability Rules for a CMOS Cell Library
M. Rullán, F.C. Blom, J. Oliver, C. Ferrer
Research output: Chapter in Book › Chapter › Research