Original language | English |
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Pages (from-to) | --- |
Journal | IEEE Transactions on Semiconductor Manufacturing |
Volume | 4 |
Issue number | 3 |
Publication status | Published - 1 Jan 1991 |
Latch Up Characterization Using Novel Test Structures and Instruments
C. Cané, M. Lozano, E. Cabruja, J. Anguita, LORA TAMAYO E., F. Serra Mestres
Research output: Contribution to journal › Article › Research
1
Citation
(Scopus)