Latch Up Characterization Using Novel Test Structures and Instruments

C. Cané, M. Lozano, E. Cabruja, J. Anguita, LORA TAMAYO E., F. Serra Mestres

Research output: Contribution to journalArticleResearch

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)---
JournalIEEE Transactions on Semiconductor Manufacturing
Volume4
Issue number3
Publication statusPublished - 1 Jan 1991

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