Interplay of Voltage and Temperature Acceleration of Oxide Breakdown for Ultra-Thin Oxides

E. Wu, J. Suñé, W. Lai, E. Nowak, J. McKenna, A. Vayshenker, D. Harmon

    Research output: Contribution to journalArticleResearch

    94 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)1787-1798
    JournalSolid-state electronics
    Volume46
    Issue number11
    DOIs
    Publication statusPublished - 1 Jan 2002

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