Interface state density measurement in MOS structures by analysis of the thermally stimulated conductance

A. de Dios, E. Castán, L. Bailón, J. Barbolla, M. Lozano, LORA TAMAYO E.

Research output: Contribution to journalArticleResearch

12 Citations (Scopus)
Original languageEnglish
Pages (from-to)987-992
JournalSolid-state electronics
Volume33
Issue number8
Publication statusPublished - 1 Jan 1990

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