Influence of the interface trap location in the performance and variability of ultra-scaled MOSFETs

V. Velayudhan, F. Gamiz, R. Rodriguez, M. Nafria, X. Aymerich, Javier Martin Martinez

Research output: Contribution to journalArticleResearch

13 Citations (Scopus)
Original languageEnglish
Pages (from-to)1243-1246
JournalMicroelectronics Reliability
Volume53
Issue number9
Publication statusPublished - 1 Jan 2013

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