Influence of the interface trap location in the performance and variability of ultra-scaled MOSFETs

Research output: Contribution to journal › Article › Research

Original language	English
Pages (from-to)	1243-1246
Journal	Microelectronics Reliability
Volume	53
Issue number	9
Publication status	Published - 1 Jan 2013

Cite this

@article{4db7685a6d144d42b4d10c29fd982ea7,

title = "Influence of the interface trap location in the performance and variability of ultra-scaled MOSFETs",

author = "V. Velayudhan and F. Gamiz and R. Rodriguez and M. Nafria and X. Aymerich and {Martin Martinez}, Javier",

year = "2013",

month = jan,

day = "1",

language = "English",

volume = "53",

pages = "1243--1246",

number = "9",

}