Original language | English |
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Pages (from-to) | 1243-1246 |
Journal | Microelectronics Reliability |
Volume | 53 |
Issue number | 9 |
Publication status | Published - 1 Jan 2013 |
Influence of the interface trap location in the performance and variability of ultra-scaled MOSFETs
V. Velayudhan, F. Gamiz, R. Rodriguez, M. Nafria, X. Aymerich, Javier Martin Martinez
Research output: Contribution to journal › Article › Research
13
Citations
(Scopus)