@article{257d072264644e55a5f9c193e83c7ee3,
title = "In Situ Demonstration of the Link Between Mechanical Strength and Resistive Switching in Resistive Random-Access Memories",
keywords = "conductive atomic force microscope, conductive filament, grain boundaries, mechanical stress, resistive switching",
author = "Yuanyuan Shi and Yanfeng Ji and Fei Hui and Montserrat Nafria and Marc Porti and Gennadi Bersuker and Mario Lanza",
year = "2015",
month = jan,
day = "1",
doi = "10.1002/aelm.201400058",
language = "English",
volume = "1",
journal = "Advanced Electronic Materials",
issn = "2199-160X",
number = "4",
}