Implanted and irradiated Si O2 Si structure electrical properties at the nanoscale

M. Porti, N. Nafria, S. Gerardin, X. Aymerich, A. Cester, A. Paccagnella, G. Ghidini

Research output: Contribution to journalArticleResearchpeer-review

Fingerprint

Dive into the research topics of 'Implanted and irradiated Si O2 Si structure electrical properties at the nanoscale'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy