High temperature up-rating assesment by electrical and thermal simulation

C. Ferrer, E. Martín, P. Godignon

    Research output: Chapter in BookChapterResearch

    Original languageEnglish
    Title of host publicationProceedings of the International IEEE Conference on the Business of Electrical Product Reliability and Liability
    Place of PublicationPiscataway (US)
    Pages87-97
    Number of pages10
    Edition-
    Publication statusPublished - 1 Jan 2003

    Cite this

    Ferrer, C., Martín, E., & Godignon, P. (2003). High temperature up-rating assesment by electrical and thermal simulation. In Proceedings of the International IEEE Conference on the Business of Electrical Product Reliability and Liability (- ed., pp. 87-97).