Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

M. Lanza; A. Bayerl; T. Gao; M. Porti; M. Nafria; G. Y. Jing; Y. F. Zhang; Z. F. Liu; H. L. Duan

doi:10.1002/adma.201204380

Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

M. Lanza, A. Bayerl, T. Gao, M. Porti, M. Nafria, G. Y. Jing, Y. F. Zhang, Z. F. Liu, H. L. Duan

Department of Electronic Engineering

Research output: Contribution to journal › Article › Research › peer-review

51 Citations (Scopus)

Abstract

Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Original language	English
Pages (from-to)	1440-1444
Journal	Advanced Materials
Volume	25
DOIs	https://doi.org/10.1002/adma.201204380
Publication status	Published - 13 Mar 2013

Keywords

atomic force microscopy
chemical vapor deposition
electrochemical metallization
graphene
tip wearing

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10.1002/adma.201204380

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abstract = "Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. {\textcopyright} 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.",

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T1 - Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

AU - Lanza, M.

AU - Bayerl, A.

AU - Gao, T.

AU - Porti, M.

AU - Nafria, M.

AU - Jing, G. Y.

AU - Zhang, Y. F.

AU - Liu, Z. F.

AU - Duan, H. L.

PY - 2013/3/13

Y1 - 2013/3/13

N2 - Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

AB - Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

KW - atomic force microscopy

KW - chemical vapor deposition

KW - electrochemical metallization

KW - graphene

KW - tip wearing

U2 - 10.1002/adma.201204380

DO - 10.1002/adma.201204380

M3 - Article

SN - 0935-9648

VL - 25

SP - 1440

EP - 1444

JO - Advanced Materials

JF - Advanced Materials

ER -

Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

Abstract

Keywords

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