Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

M. Lanza, A. Bayerl, T. Gao, M. Porti, M. Nafria, G. Y. Jing, Y. F. Zhang, Z. F. Liu, H. L. Duan

Research output: Contribution to journalArticleResearchpeer-review

43 Citations (Scopus)

Abstract

Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Original languageEnglish
Pages (from-to)1440-1444
JournalAdvanced Materials
Volume25
DOIs
Publication statusPublished - 13 Mar 2013

Keywords

  • atomic force microscopy
  • chemical vapor deposition
  • electrochemical metallization
  • graphene
  • tip wearing

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