Gate dielectric degradation in CMOS inverters

Keyphrases

• Carrier Contribution 50%
• Channel Hot Carrier 50%
• Channel Hot Carrier Stress 50%
• CMOS Inverter 100%
• DC Output 50%
• Dielectric Degradation 100%
• Electrical Response 50%
• Fowler-Nordheim 50%
• Gate Dielectric 100%
• Gate Oxide Breakdown 50%
• Input Frequency 50%
• Input Signals 100%
• Inverter 50%
• Inverter Voltage 50%
• NMOS 100%
• Oxide Breakdown 50%
• PMOS 50%
• Pulse Signal 50%
• Saturation Current 50%
• State Transition 50%
• Stress Conditions 50%
• Stress-driven 50%
• Transistor 100%
• Voltage Transfer Characteristics 50%

Material Science

• Dielectric Material 100%
• Electronic Circuit 100%
• Hot Carrier 100%
• Oxide Compound 100%
• Transistor 100%

Engineering

• Gate Dielectric 100%
• Gate Oxide 50%
• Input Frequency 50%
• Input Signal 100%
• Output Circuit 50%
• State Transition 50%
• Stress Condition 50%