From post-breakdown conduction to resistive switching effect in thin dielectric films

E. Miranda*, D. Jiménez, J. Suñé

*Corresponding author for this work

Research output: Contribution to journalArticleResearchpeer-review

4 Citations (Scopus)

Abstract

The hysteretic nature of the filamentary electron transport in MIM/MIS resistive switching devices is modeled within the framework of the Landauer theory for mesoscopic conductors. It is shown that a two-equation system, one equation for the current-voltage (I-V) characteristic of a nano-sized constriction and a second equation for the time dependence of the confining potential yield the wide variety of I-V hysteretic behaviors reported in literature. The proposed model is consistent with a number of experimental observations and is a clear example of a nonlinear memristive system. Moreover, because of its mathematical simplicity and flexibility it is well-suited for circuit simulators.

Original languageEnglish
Pages (from-to)GD.5.1-GD.5.6
Number of pages6
JournalIEEE International Reliability Physics Symposium Proceedings
DOIs
Publication statusPublished - 2012

Keywords

  • memristor
  • oxide breakdown
  • post-breakdown
  • reliability
  • resistive switching

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