Abstract
The hysteretic nature of the filamentary electron transport in MIM/MIS resistive switching devices is modeled within the framework of the Landauer theory for mesoscopic conductors. It is shown that a two-equation system, one equation for the current-voltage (I-V) characteristic of a nano-sized constriction and a second equation for the time dependence of the confining potential yield the wide variety of I-V hysteretic behaviors reported in literature. The proposed model is consistent with a number of experimental observations and is a clear example of a nonlinear memristive system. Moreover, because of its mathematical simplicity and flexibility it is well-suited for circuit simulators.
Original language | English |
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Pages (from-to) | GD.5.1-GD.5.6 |
Number of pages | 6 |
Journal | IEEE International Reliability Physics Symposium Proceedings |
DOIs | |
Publication status | Published - 2012 |
Keywords
- memristor
- oxide breakdown
- post-breakdown
- reliability
- resistive switching