Fine grain partial reconfiguration for fault emulation and precise LUT modification

L.A. Cardona, B. Lorente, C. Ferrer

Research output: Chapter in Book › Chapter › Research

Original language	English
Title of host publication	DATE W10: TRUDEVICE 2015: 3rd Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (co-located to DATE'15)
Place of Publication	Brussel·les (BE)
Pages	1-2
Number of pages	1
Edition	1
Publication status	Published - 1 Jan 2015

Cite this

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title = "Fine grain partial reconfiguration for fault emulation and precise LUT modification",

author = "L.A. Cardona and B. Lorente and C. Ferrer",

year = "2015",

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day = "1",

language = "English",

isbn = "978-3-9815370-4-8",

pages = "1--2",

booktitle = "DATE W10: TRUDEVICE 2015: 3rd Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (co-located to DATE'15)",

edition = "1",

}

TY - CHAP

T1 - Fine grain partial reconfiguration for fault emulation and precise LUT modification

AU - Cardona, L.A.

AU - Lorente, B.

AU - Ferrer, C.

PY - 2015/1/1

Y1 - 2015/1/1

M3 - Chapter

SN - 978-3-9815370-4-8

SP - 1

EP - 2

BT - DATE W10: TRUDEVICE 2015: 3rd Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (co-located to DATE'15)

CY - Brussel·les (BE)

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