Fine grain partial reconfiguration for fault emulation and precise LUT modification

L.A. Cardona, B. Lorente, C. Ferrer

Research output: Chapter in BookChapterResearch

Original languageEnglish
Title of host publicationDATE W10: TRUDEVICE 2015: 3rd Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (co-located to DATE'15)
Place of PublicationBrussel·les (BE)
Number of pages1
Publication statusPublished - 1 Jan 2015

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