Field-effect control of breakdown paths in HfO2 based MIM structures

X. Saura, X. Lian, D. Jiménez, E. Miranda, X. Borrisé, F. Campabadal, J. Suñé

Research output: Contribution to journalArticleResearch

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)1346-1350
JournalMicroelectronics Reliability
Volume53
Issue number9-11
DOIs
Publication statusPublished - 1 Jan 2013

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