Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics

N. Baghban-Bousari; D. Eric; G. Palau; A. Crespo-Yepes; M. Porti; E. Ramon; S. Ogier; M. Nafria

doi:10.1016/j.mee.2025.112407

Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics

N. Baghban-Bousari^*, D. Eric, G. Palau, A. Crespo-Yepes, M. Porti, E. Ramon, S. Ogier, M. Nafria

^*Corresponding author for this work

Department of Electronic Engineering

Research output: Contribution to journal › Article › Research › peer-review

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Abstract

Pre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (I_D) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively.

Original language	English
Article number	112407
Number of pages	5
Journal	Microelectronic Engineering
Volume	302
DOIs	https://doi.org/10.1016/j.mee.2025.112407
Publication status	Published - 11 Jan 2026

Keywords

OTFT
PUF
Reliability
Uniformity
Uniqueness

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10.1016/j.mee.2025.112407

https://ddd.uab.cat/record/320859

Cite this

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title = "Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics",

abstract = "Pre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (ID) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively.",

keywords = "OTFT, PUF, Reliability, Uniformity, Uniqueness",

author = "N. Baghban-Bousari and D. Eric and G. Palau and A. Crespo-Yepes and M. Porti and E. Ramon and S. Ogier and M. Nafria",

note = "Publisher Copyright: {\textcopyright} 2025 The Authors",

year = "2026",

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day = "11",

doi = "10.1016/j.mee.2025.112407",

language = "English",

volume = "302",

journal = "Microelectronic Engineering",

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T1 - Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics

AU - Baghban-Bousari, N.

AU - Eric, D.

AU - Palau, G.

AU - Crespo-Yepes, A.

AU - Porti, M.

AU - Ramon, E.

AU - Ogier, S.

AU - Nafria, M.

PY - 2026/1/11

Y1 - 2026/1/11

N2 - Pre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (ID) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively.

AB - Pre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (ID) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively.

KW - OTFT

KW - PUF

KW - Reliability

KW - Uniformity

KW - Uniqueness

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UR - https://portalrecerca.uab.cat/en/publications/0cdb033d-4abb-43a7-9135-ffb4fd6aec26

U2 - 10.1016/j.mee.2025.112407

DO - 10.1016/j.mee.2025.112407

M3 - Article

AN - SCOPUS:105016017121

SN - 0167-9317

VL - 302

JO - Microelectronic Engineering

JF - Microelectronic Engineering

M1 - 112407

ER -

Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics

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Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics

Abstract

Keywords

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Replication Data for: Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics

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