| Original language | English |
|---|---|
| Pages (from-to) | 169-180 |
| Journal | Journal of Microelectronic Testing (JETTA): Theory and Applications. Kluwer Academic Publishers. |
| Volume | 14 |
| Issue number | 1 |
| Publication status | Published - 1 Jan 1999 |
Fault-Tolerant Memory Architecture Against Radiation-Dependent Errors: A Mixed Error Control Approach.
O.D. Mocanu, J. Oliver
Research output: Contribution to journal › Article › Research