Fault-Tolerant Memory Architecture Against Radiation-Dependent Errors: A Mixed Error Control Approach.

O.D. Mocanu, J. Oliver

Research output: Contribution to journalArticleResearch

Original languageEnglish
Pages (from-to)169-180
JournalJournal of Microelectronic Testing (JETTA): Theory and Applications. Kluwer Academic Publishers.
Volume14
Issue number1
Publication statusPublished - 1 Jan 1999

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