Fault characterization for IC testing by current leakage measurement

A. Alvarez, N. Fàbregas, C. Ferrer, J. Oliver, M. Rullán

    Research output: Chapter in BookChapterResearch

    Original languageEnglish
    Title of host publicationProceedings del ISMM Internatinal Workshop on Parallel Computing
    Place of PublicationZurich (CH)
    Pages200-203
    Number of pages3
    Edition-
    Publication statusPublished - 1 Jan 1991

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