Extended Abstracts of the International Conference on Solid State Devices and Materials. "Experimental Study of the soft-breakdown I-V characteristics in ultrathin SiO2 layers. Extended Abstracts of the International Conference on Solid State Devices and Materials.

A. Miranda, R. Rodríguez, J. Suñé, M. Nafría, X. Aymerich, Japan Society of Applied Physics (Editor)

Research output: Book/ReportProceedingResearch

Original languageUndefined/Unknown
Place of PublicationHiroshima (JP)
Number of pages2
Publication statusPublished - Jun 1998

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