Exploitation of OTFTs variability for PUFs implementation and impact of aging

Sergi Claramunt Ruiz; Gerard Palau; August  Arnal; Albert Crespo Yepes; Marc Porti Pujal; S.  Ogier; Eloi Ramon Garcia; M Nafria

doi:10.1016/j.sse.2023.108698

Exploitation of OTFTs variability for PUFs implementation and impact of aging

Sergi Claramunt Ruiz, Gerard Palau, August Arnal, Albert Crespo Yepes, Marc Porti Pujal, S. Ogier, Eloi Ramon Garcia, M Nafria

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Abstract

Commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their variability and reliability. The feasibility of implementing Physical Unclonable Functions (PUFs) based on these devices has been evaluated, taking advantage of the high variation in the electrical characteristics among different OTFTs. The eventual impact of device aging on PUFs reliability has been preliminary explored.

Original language	English
Article number	108698
Number of pages	4
Journal	Solid-State Electronics
Volume	207
DOIs	https://doi.org/10.1016/j.sse.2023.108698
Publication status	Published - Sept 2023

Keywords

Aging
OTFT
PUF
Reliability
Variability

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10.1016/j.sse.2023.108698Licence: CC BY-NC-ND

https://ddd.uab.cat/record/283390

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title = "Exploitation of OTFTs variability for PUFs implementation and impact of aging",

abstract = "Commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their variability and reliability. The feasibility of implementing Physical Unclonable Functions (PUFs) based on these devices has been evaluated, taking advantage of the high variation in the electrical characteristics among different OTFTs. The eventual impact of device aging on PUFs reliability has been preliminary explored.",

keywords = "Aging, OTFT, PUF, Reliability, Variability",

author = "{Claramunt Ruiz}, Sergi and Gerard Palau and August Arnal and {Crespo Yepes}, Albert and {Porti Pujal}, Marc and S. Ogier and {Ramon Garcia}, Eloi and M Nafria",

note = "Publisher Copyright: {\textcopyright} 2023 The Author(s)",

year = "2023",

month = sep,

doi = "10.1016/j.sse.2023.108698",

language = "English",

volume = "207",

journal = "Solid-State Electronics",

issn = "0038-1101",

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TY - JOUR

T1 - Exploitation of OTFTs variability for PUFs implementation and impact of aging

AU - Claramunt Ruiz, Sergi

AU - Palau, Gerard

AU - Arnal, August

AU - Crespo Yepes, Albert

AU - Porti Pujal, Marc

AU - Ogier, S.

AU - Ramon Garcia, Eloi

AU - Nafria, M

PY - 2023/9

Y1 - 2023/9

N2 - Commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their variability and reliability. The feasibility of implementing Physical Unclonable Functions (PUFs) based on these devices has been evaluated, taking advantage of the high variation in the electrical characteristics among different OTFTs. The eventual impact of device aging on PUFs reliability has been preliminary explored.

AB - Commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their variability and reliability. The feasibility of implementing Physical Unclonable Functions (PUFs) based on these devices has been evaluated, taking advantage of the high variation in the electrical characteristics among different OTFTs. The eventual impact of device aging on PUFs reliability has been preliminary explored.

KW - Aging

KW - OTFT

KW - PUF

KW - Reliability

KW - Variability

UR - http://www.scopus.com/inward/record.url?scp=85163561360&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/df07afde-6d3a-3acf-92ab-48f65ac24c1c/

U2 - 10.1016/j.sse.2023.108698

DO - 10.1016/j.sse.2023.108698

M3 - Article

SN - 0038-1101

VL - 207

JO - Solid-State Electronics

JF - Solid-State Electronics

M1 - 108698

ER -

Exploitation of OTFTs variability for PUFs implementation and impact of aging

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Keywords

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