Exploitation of OTFTs variability for PUFs implementation and impact of aging

Sergi Claramunt Ruiz, Gerard Palau, August Arnal, Albert Crespo Yepes, Marc Porti Pujal, S. Ogier, Eloi Ramon, M Nafria

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Commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their variability and reliability. The feasibility of implementing Physical Unclonable Functions (PUFs) based on these devices has been evaluated, taking advantage of the high variation in the electrical characteristics among different OTFTs. The eventual impact of device aging on PUFs reliability has been preliminary explored.
Original languageEnglish
Article number108698
Number of pages4
JournalSolid-State Electronics
Publication statusPublished - Sept 2023


  • Aging
  • OTFT
  • PUF
  • Reliability
  • Variability


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