Explicit model for the gate tunneling current in double-gate MOSFETs

Ferney Chaves; David Jiménez; Jordi Suñé

doi:10.1016/j.sse.2011.11.003

Explicit model for the gate tunneling current in double-gate MOSFETs

Ferney Chaves, David Jiménez, Jordi Suñé

Department of Electronic Engineering

Research output: Contribution to journal › Article › Research › peer-review

9 Citations (Scopus)

Abstract

In this paper, we present an explicit compact quantum model for the gate tunneling current in double-gate metal-oxide-semiconductor field-effect transistors (DG-MOSFETs). Specifically, an explicit closed-form expression is proposed, useful for the fast evaluation of the gate leakage in the context of electrical circuit simulators. A benchmarking test against 1D self-consistent numerical solution of Schrödinger-Poisson (SP) equations has been performed to demonstrate the accuracy of the model. © 2011 Elsevier Ltd. All rights reserved.

Original language	English
Pages (from-to)	93-97
Journal	Solid-State Electronics
Volume	68
DOIs	https://doi.org/10.1016/j.sse.2011.11.003
Publication status	Published - 1 Feb 2012

Keywords

Direct tunneling
Double-gate MOSFETs
Gate tunneling
Modeling quantization

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10.1016/j.sse.2011.11.003

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@article{6815ebecb5bd460c9d3bd48189493bef,

title = "Explicit model for the gate tunneling current in double-gate MOSFETs",

abstract = "In this paper, we present an explicit compact quantum model for the gate tunneling current in double-gate metal-oxide-semiconductor field-effect transistors (DG-MOSFETs). Specifically, an explicit closed-form expression is proposed, useful for the fast evaluation of the gate leakage in the context of electrical circuit simulators. A benchmarking test against 1D self-consistent numerical solution of Schr{\"o}dinger-Poisson (SP) equations has been performed to demonstrate the accuracy of the model. {\textcopyright} 2011 Elsevier Ltd. All rights reserved.",

keywords = "Direct tunneling, Double-gate MOSFETs, Gate tunneling, Modeling quantization",

author = "Ferney Chaves and David Jim{\'e}nez and Jordi Su{\~n}{\'e}",

year = "2012",

month = feb,

day = "1",

doi = "10.1016/j.sse.2011.11.003",

language = "English",

volume = "68",

pages = "93--97",

journal = "Solid-State Electronics",

issn = "0038-1101",

publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Explicit model for the gate tunneling current in double-gate MOSFETs

AU - Chaves, Ferney

AU - Jiménez, David

AU - Suñé, Jordi

PY - 2012/2/1

Y1 - 2012/2/1

N2 - In this paper, we present an explicit compact quantum model for the gate tunneling current in double-gate metal-oxide-semiconductor field-effect transistors (DG-MOSFETs). Specifically, an explicit closed-form expression is proposed, useful for the fast evaluation of the gate leakage in the context of electrical circuit simulators. A benchmarking test against 1D self-consistent numerical solution of Schrödinger-Poisson (SP) equations has been performed to demonstrate the accuracy of the model. © 2011 Elsevier Ltd. All rights reserved.

AB - In this paper, we present an explicit compact quantum model for the gate tunneling current in double-gate metal-oxide-semiconductor field-effect transistors (DG-MOSFETs). Specifically, an explicit closed-form expression is proposed, useful for the fast evaluation of the gate leakage in the context of electrical circuit simulators. A benchmarking test against 1D self-consistent numerical solution of Schrödinger-Poisson (SP) equations has been performed to demonstrate the accuracy of the model. © 2011 Elsevier Ltd. All rights reserved.

KW - Direct tunneling

KW - Double-gate MOSFETs

KW - Gate tunneling

KW - Modeling quantization

U2 - 10.1016/j.sse.2011.11.003

DO - 10.1016/j.sse.2011.11.003

M3 - Article

SN - 0038-1101

VL - 68

SP - 93

EP - 97

JO - Solid-State Electronics

JF - Solid-State Electronics

ER -

Explicit model for the gate tunneling current in double-gate MOSFETs

Abstract

Keywords

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