Fingerprint
Dive into the research topics of 'Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation between Device and Circuit Degradation'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation between Device and Circuit Degradation
Rosana Rodriguez, Albert Crespo-Yepes, Javier Martin-Martinez, Montserrat Nafria, Xavier Aragones, Diego Mateo, Enrique Barajas
Research output: Other contribution
2
Citations
(Scopus)