TY - BOOK
T1 - Experimental Characterization of Time-Dependent Variability in Ring Oscillators
AU - Nuñez, J.
AU - Roca, E.
AU - Castro-Lopez, R.
AU - Martin-Martinez, J.
AU - Rodriguez, R.
AU - Nafria, M.
AU - Fernandez, F. V.
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/7
Y1 - 2019/7
N2 - Reliability in CMOS-based integrated circuits has always been a critical concern. In today's ultra-scaled technologies, a time-varying kind of variability has raised that, on top of the well-known time-zero variability, threatens to shorten the lifetime of integrated circuits, both analog and digital. Effects like Bias Temperature Instability and Hot Carriers Injection need to be studied, characterized and modeled to include, and, thus, mitigate, their impact in the design of CMOS integrated circuits. This paper presents an array-based integrated circuit whose purpose is precisely that: to observe, quantify and characterize the impact of time-dependent variability effects in a specific kind of circuits: Ring Oscillators.
AB - Reliability in CMOS-based integrated circuits has always been a critical concern. In today's ultra-scaled technologies, a time-varying kind of variability has raised that, on top of the well-known time-zero variability, threatens to shorten the lifetime of integrated circuits, both analog and digital. Effects like Bias Temperature Instability and Hot Carriers Injection need to be studied, characterized and modeled to include, and, thus, mitigate, their impact in the design of CMOS integrated circuits. This paper presents an array-based integrated circuit whose purpose is precisely that: to observe, quantify and characterize the impact of time-dependent variability effects in a specific kind of circuits: Ring Oscillators.
KW - Bias Temperature Instability
KW - Frequency degradation
KW - Hot Carriers Injection
KW - Ring oscillators
UR - http://www.scopus.com/inward/record.url?scp=85071569752&partnerID=8YFLogxK
U2 - 10.1109/SMACD.2019.8795300
DO - 10.1109/SMACD.2019.8795300
M3 - Proceeding
AN - SCOPUS:85071569752
T3 - SMACD 2019 - 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Proceedings
BT - Experimental Characterization of Time-Dependent Variability in Ring Oscillators
PB - Institute of Electrical and Electronics Engineers Inc.
ER -