Enhanced electrical performance for conductive atomic force microscopy

X Blasco, M Nafria, X Aymerich

Research output: Contribution to journal › Article › Research

Original language	English
Pages (from-to)	016105-1-016105-1
Journal	Review of Scientific Instruments
Volume	76
Issue number	1
DOIs	https://doi.org/10.1063/1.1832579
Publication status	Published - 1 Jan 2005

Access to Document

@article{11b0d5451e0c45bab9571fcef6090156,

title = "Enhanced electrical performance for conductive atomic force microscopy",

author = "X Blasco and M Nafria and X Aymerich",

year = "2005",

month = jan,

day = "1",

doi = "10.1063/1.1832579",

language = "English",

volume = "76",

pages = "016105--1--016105--1",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

number = "1",

}