Original language | English |
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Pages (from-to) | 4277-4281 |
Journal | Thin Solid Films |
Volume | 516 |
Issue number | 12 |
DOIs | |
Publication status | Published - 1 Jan 2008 |
Ellipsometric study of crystallization of amorphous Ge thin films embedded in SiO2
M.I. Alonso, M. Garriga, A. Bernardi, A.R. Goñi, A.F. Lopeandia, G. Garcia, J. Rodríguez-Viejo, J.L. Lábár
Research output: Contribution to journal › Article › Research
11
Citations
(Scopus)