Ellipsometric study of crystallization of amorphous Ge thin films embedded in SiO2

M.I. Alonso, M. Garriga, A. Bernardi, A.R. Goñi, A.F. Lopeandia, G. Garcia, J. Rodríguez-Viejo, J.L. Lábár

Research output: Contribution to journalArticleResearch

10 Citations (Scopus)
Original languageEnglish
Pages (from-to)4277-4281
JournalThin Solid Films
Volume516
Issue number12
DOIs
Publication statusPublished - 1 Jan 2008

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