Ellipsometric study of crystallization of amorphous Ge thin films embedded in SiO2

M.I. Alonso; M. Garriga; A. Bernardi; A.R. Goñi; A.F. Lopeandia; G. Garcia; J. Rodríguez-Viejo; J.L. Lábár

doi:https://doi.org/10.1016/j.tsf.2008.01.003

Ellipsometric study of crystallization of amorphous Ge thin films embedded in SiO2

M.I. Alonso, M. Garriga, A. Bernardi, A.R. Goñi, A.F. Lopeandia, G. Garcia, J. Rodríguez-Viejo, J.L. Lábár

Department of Physics

Research output: Contribution to journal › Article › Research

11 Citations (Scopus)

Original language	English
Pages (from-to)	4277-4281
Journal	Thin Solid Films
Volume	516
Issue number	12
DOIs	https://doi.org/10.1016/j.tsf.2008.01.003
Publication status	Published - 1 Jan 2008

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https://doi.org/10.1016/j.tsf.2008.01.003

Cite this

@article{a33377b9902e43d49b099377065ad319,

title = "Ellipsometric study of crystallization of amorphous Ge thin films embedded in SiO2",

author = "M.I. Alonso and M. Garriga and A. Bernardi and A.R. Go{\~n}i and A.F. Lopeandia and G. Garcia and J. Rodr{\'i}guez-Viejo and J.L. L{\'a}b{\'a}r",

year = "2008",

month = jan,

day = "1",

doi = "https://doi.org/10.1016/j.tsf.2008.01.003",

language = "English",

volume = "516",

pages = "4277--4281",

journal = "Thin Solid Films",

issn = "0040-6090",

number = "12",

}

TY - JOUR

T1 - Ellipsometric study of crystallization of amorphous Ge thin films embedded in SiO2

AU - Alonso, M.I.

AU - Garriga, M.

AU - Bernardi, A.

AU - Goñi, A.R.

AU - Lopeandia, A.F.

AU - Garcia, G.

AU - Rodríguez-Viejo, J.

AU - Lábár, J.L.

PY - 2008/1/1

Y1 - 2008/1/1

U2 - https://doi.org/10.1016/j.tsf.2008.01.003

DO - https://doi.org/10.1016/j.tsf.2008.01.003

M3 - Article

VL - 516

SP - 4277

EP - 4281

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 12

ER -