Electrical resolution during Conductive AFM measurements under different environmental conditions and contact forces

M. Lanza, M. Porti, M. Nafría, X. Aymerich, E. Wittaker, B. Hamilton

Research output: Contribution to journalArticleResearchpeer-review

44 Citations (Scopus)
Original languageEnglish
Pages (from-to)106110-
JournalReview of Scientific Instruments
Volume81
Issue number10
DOIs
Publication statusPublished - 1 Mar 2010

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