Electrical evidence of atomic-size effects in the conduction filament of RRAM

J. Sune, S. Long, C. Cagli, L. Perniola, X. Lian, X. Cartoixa, R. Rurali, E. Miranda, D. Jimenez, M. Liu

Research output: Chapter in BookChapterResearch

Original languageEnglish
Title of host publication2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
Editors Tang, TA, Jiang, YL
Place of PublicationNova York (US)
Pages485-488
Number of pages3
Edition1
Publication statusPublished - 1 Jan 2012

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