Electrical evidence of atomic-size effects in the conduction filament of RRAM

J. Sune; S. Long; C. Cagli; L. Perniola; X. Lian; X. Cartoixa; R. Rurali; E. Miranda; D. Jimenez; M. Liu

Electrical evidence of atomic-size effects in the conduction filament of RRAM

J. Sune, S. Long, C. Cagli, L. Perniola, X. Lian, X. Cartoixa, R. Rurali, E. Miranda, D. Jimenez, M. Liu

Research output: Chapter in Book › Chapter › Research

Original language	English
Title of host publication	2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
Editors	Tang, TA, Jiang, YL
Place of Publication	Nova York (US)
Pages	485-488
Number of pages	3
Edition	1
Publication status	Published - 1 Jan 2012

Cite this

Sune, J. ; Long, S. ; Cagli, C. ; Perniola, L. ; Lian, X. ; Cartoixa, X. ; Rurali, R. ; Miranda, E. ; Jimenez, D. ; Liu, M. / Electrical evidence of atomic-size effects in the conduction filament of RRAM. 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT). editor / Tang, TA ; Jiang, YL. 1. ed. Nova York (US), 2012. pp. 485-488

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year = "2012",

month = jan,

day = "1",

language = "English",

isbn = "978-1-4673-2474-8",

pages = "485--488",

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booktitle = "2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)",

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Electrical evidence of atomic-size effects in the conduction filament of RRAM. / Sune, J.; Long, S.; Cagli, C.; Perniola, L.; Lian, X.; Cartoixa, X.; Rurali, R.; Miranda, E.; Jimenez, D.; Liu, M.

2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT). ed. / Tang, TA; Jiang, YL. 1. ed. Nova York (US), 2012. p. 485-488.

Research output: Chapter in Book › Chapter › Research

TY - CHAP

T1 - Electrical evidence of atomic-size effects in the conduction filament of RRAM

AU - Sune, J.

AU - Long, S.

AU - Cagli, C.

AU - Perniola, L.

AU - Lian, X.

AU - Cartoixa, X.

AU - Rurali, R.

AU - Miranda, E.

AU - Jimenez, D.

AU - Liu, M.

PY - 2012/1/1

Y1 - 2012/1/1

M3 - Chapter

SN - 978-1-4673-2474-8

SP - 485

EP - 488

BT - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

A2 - Tang, TA, null

A2 - Jiang, YL, null

CY - Nova York (US)

ER -