Original language | English |
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Title of host publication | 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) |
Editors | Tang, TA, Jiang, YL |
Place of Publication | Nova York (US) |
Pages | 485-488 |
Number of pages | 3 |
Edition | 1 |
Publication status | Published - 1 Jan 2012 |
Electrical evidence of atomic-size effects in the conduction filament of RRAM
J. Sune, S. Long, C. Cagli, L. Perniola, X. Lian, X. Cartoixa, R. Rurali, E. Miranda, D. Jimenez, M. Liu
Research output: Chapter in Book › Chapter › Research