Electrical characterization of the soft breakdown failure mode in MgO layers

E. Miranda, E. O'Connor, K. Cherkaoui, S. Monaghan, R. Long, D. O'Connell, P. K. Hurley, G. Hughes, P. Casey

Research output: Contribution to journalArticleResearchpeer-review

8 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Electrical characterization of the soft breakdown failure mode in MgO layers'. Together they form a unique fingerprint.

Physics & Astronomy