Electrical characterization of MOS structures with Si-Nanocrystals as memory devices: a nanoscale approach with AFM

M. Porti, M. Nafria, X. Aymerich, Hongquig Hu (Editor)

Research output: Chapter in BookChapterResearch

Original languageEnglish
Title of host publicationNanocrystals: Properties, Preparation and Applications
Place of PublicationNova York (US)
Number of pages23
Publication statusPublished - 1 Jan 2009

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