Effect of anisotropy on the critical antiferromagnet thickness in exchange-biased bilayers

M. S. Lund, W. A. Macedo, Kai Liu, J. Nogués, Ivan K. Schuller, C. Leighton

Research output: Contribution to journal › Article › Research

91 Citations (Scopus)

Original language	English
Article number	054422
Pages (from-to)	544221-544227
Journal	Physical Review B-Condensed Matter
Volume	66
Issue number	5
DOIs	https://doi.org/10.1103/PhysRevB.66.054422
Publication status	Published - 1 Aug 2002

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@article{2600c4f06e604fb896360f03bbc9d59d,

title = "Effect of anisotropy on the critical antiferromagnet thickness in exchange-biased bilayers",

author = "Lund, {M. S.} and Macedo, {W. A.} and Kai Liu and J. Nogu{\'e}s and Schuller, {Ivan K.} and C. Leighton",

year = "2002",

month = aug,

day = "1",

doi = "10.1103/PhysRevB.66.054422",

language = "English",

volume = "66",

pages = "544221--544227",

number = "5",

}

TY - JOUR

T1 - Effect of anisotropy on the critical antiferromagnet thickness in exchange-biased bilayers

AU - Lund, M. S.

AU - Macedo, W. A.

AU - Liu, Kai

AU - Nogués, J.

AU - Schuller, Ivan K.

AU - Leighton, C.

PY - 2002/8/1

Y1 - 2002/8/1

U2 - 10.1103/PhysRevB.66.054422

DO - 10.1103/PhysRevB.66.054422

M3 - Article

VL - 66

SP - 544221

EP - 544227

IS - 5

M1 - 054422

ER -